SLLS266 - FEBRUARY 1997 266 - FEBRUARY 1997
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of TexasInstruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
IEC1000-4-2 ESD performance is measured at the systems level and system designs influence the results of these tests. Testing done at the component level act as an indicator that the system passes at a particular compliance level, but does not ensure that the system passes at that level. The Texas Instruments USB EVM with the TUSB2040 USB controller (2-kV HBM and 200-V MM) was used for the test platform.
The SN75240 is four transient voltage suppressors designed to provide additional electrical noise transient protection to two USB ports. Any cabled I/O can be subjected to electrical noise transients from various sources. These noise transients can cause damage to the USB transceiver and/or the USB ASIC if they are of sufficient magnitude and duration. The USB ports are typically implemented in 3-V or 5-V digital CMOS with very limited ESD protection. The SN75240 can significantly increase the port ESD protection level and reduce the risk of damage to the large and expensive circuits of the USB port.
View more information about generic part numbers:SN75240
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