SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES

SCBS471 - JUNE 1990 - REVISED JUNE 1994

features

• Member of the Texas Instruments SCOPE ^TM Family of Testability Products
• Octal Test-Integrated Circuit
• Functionally Equivalent to SN74F373 and SN74BCT373 in the Normal-Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implements Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPE ^TM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages and Standard Plastic 300-mil DIPs (NT)

  SCOPE is a trademark of Texas Instruments Incorporated.

   

description

The SN74BCT8373 scan test device with octal D-type latches is amember of the Texas Instruments SCOPE^TM testabilityintegrated circuit family. This family of devices supports IEEEStandard 1149.1-1990 boundary scan to facilitate testing of complexcircuit-board assemblies. Scan access to the test circuitry isaccomplished via the 4-wire test access port (TAP) interface.

In the normal mode, this device is functionally equivalent to theSN74F373 and SN74BCT373 octal D-type latches. The test circuitry canbe activated by the TAP to take snapshot samples of the dataappearing at the device terminals or to perform a self test on theboundary-test cells. Activating the TAP in normal mode does notaffect the functional operation of the SCOPE^TM octallatches.

In the test mode, the normal operation of the SCOPE^TMoctal latches is inhibited and the test circuitry is enabled toobserve and control the I/O boundary of the device. When enabled, thetest circuitry can perform boundary-scan test operations as describedin IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the testcircuitry: test data input (TDI), test data output (TDO), test modeselect (TMS), and test clock (TCK). Additionally, the test circuitryperforms other testing functions such as parallel-signature analysis(PSA) on data inputs and pseudo-random pattern generation (PRPG) fromdata outputs. All testing and scan operations are synchronized to theTAP interface.

The SN74BCT8373 is characterized for operation from 0°C to70°C.

View more information about generic part numbers:SN74BCT8373

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