SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

SCBS045E - JUNE 1990 - REVISED JULY 1996

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features

• Members of the Texas Instruments SCOPE^TM Family of Testability Products
• Octal Test-Integrated Circuits
• Functionally Equivalent to 'F374 and 'BCT374 in the Normal-Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPE^TM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

  SCOPE is a trademark of Texas Instruments Incorporated.

description

The 'BCT8374A scan test devices with octal edge-triggered D-typeflip-flops are members of the Texas Instruments SCOPE^TMtestability integrated-circuit family. This family of devicessupports IEEE Standard 1149.1-1990 boundary scan to facilitatetesting of complex circuit-board assemblies. Scan access to the testcircuitry is accomplished via the 4-wire test access port (TAP)interface.

In the normal mode, these devices are functionally equivalent tothe 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry canbe activated by the TAP to take snapshot samples of the dataappearing at the device terminals or to perform a self test on theboundary-test cells. Activating the TAP in normal mode does notaffect the functional operation of the SCOPE^TM octalflip-flops.

In the test mode, the normal operation of the SCOPE^TMoctal flip-flops is inhibited and the test circuitry is enabled toobserve and control the I/O boundary of the device. When enabled, thetest circuitry can perform boundary-scan test operations as describedin IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the testcircuitry: test data input (TDI), test data output (TDO), test modeselect (TMS), and test clock (TCK). Additionally, the test circuitryperforms other testing functions such as parallel-signature analysis(PSA) on data inputs and pseudo-random pattern generation (PRPG) fromdata outputs. All testing and scan operations are synchronized to theTAP interface.

The SN54BCT8374A is characterized for operation over the fullmilitary temperature range of -55°C to 125°C. TheSN74BCT8374A is characterized for operation from 0°C to70°C.

View more information about generic part numbers:SN54BCT8374A, SN74BCT8374A

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