SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

SCBS044F - JUNE 1990 - REVISED JULY 1996

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features

• Members of the Texas Instruments SCOPE^TM Family of Testability Products
• Octal Test-Integrated Circuits
• Functionally Equivalent to 'F373 and 'BCT373 in the Normal-Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPE^TM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)

  SCOPE is a trademark of Texas Instruments Incorporated.

   

description

The 'BCT8373A scan test devices with octal D-type latches aremembers of the Texas Instruments SCOPE^TM testabilityintegrated- circuit family. This family of devices supports IEEE Standard1149.1-1990 boundary scan to facilitate testing of complex circuitboard assemblies. Scan access to the test circuitry is accomplishedvia the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent tothe 'F373 and 'BCT373 octal D-type latches. The test circuitry can beactivated by the TAP to take snapshot samples of the data appearingat the device terminals or to perform a self test on the boundarytest cells. Activating the TAP in normal mode does not affect thefunctional operation of the SCOPE^TM octal latches.

In the test mode, the normal operation of the SCOPE^TMoctal latches is inhibited and the test circuitry is enabled toobserve and control the I/O boundary of the device. When enabled, thetest circuitry can perform boundary scan test operations, asdescribed in IEEE Standard 1149.1-1990.

Four dedicated test terminals are used to control the operation ofthe test circuitry: test data input (TDI), test data output (TDO),test mode select (TMS), and test clock (TCK). Additionally, the testcircuitry can perform other testing functions such as parallelsignature analysis (PSA) on data inputs and pseudo-random patterngeneration (PRPG) from data outputs. All testing and scan operationsare synchronized to the TAP interface.

The SN54BCT8373A is characterized for operation over the fullmilitary temperature range of -55°C to 125°C. TheSN74BCT8373A is characterized for operation from 0°C to70°C.

View more information about generic part numbers:SN54BCT8373A, SN74BCT8373A

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