SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

SCBS043E - MAY 1990 - REVISED JULY 1996

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features

• Members of the Texas Instruments SCOPE^TM Family of Testability Products
• Octal Test-Integrated Circuits
• Functionally Equivalent to 'F245 and 'BCT245 in the Normal- Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPE^TM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)

SCOPE is a trademark of Texas InstrumentsIncorporated.

description

The 'BCT8245A scan test devices with octal bus transceivers aremembers of the Texas Instruments SCOPE^TM testabilityintegrated-circuit family. This family of devices supports IEEEStandard 1149.1-1990 boundary scan to facilitate testing of complexcircuit-board assemblies. Scan access to the test circuitry isaccomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent tothe 'F245 and 'BCT245 octal bus transceivers. The test circuitry canbe activated by the TAP to take snapshot samples of the dataappearing at the device terminals or to perform a self test on theboundary-test cells. Activating the TAP in normal mode does notaffect the functional operation of the SCOPE^TM octal bustransceivers.

In the test mode, the normal operation of the SCOPE^TMoctal bus transceivers is inhibited and the test circuitry is enabledto observe and control the I/O boundary of the device. When enabled,the test circuitry can perform boundary-scan test operations asdescribed in IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the testcircuitry: test data input (TDI), test data output (TDO), test modeselect (TMS), and test clock (TCK). Additionally, the test circuitryperforms other testing functions such as parallel-signature analysis(PSA) on data inputs and pseudo-random pattern generation (PRPG) fromdata outputs. All testing and scan operations are synchronized to theTAP interface.

The SN54BCT8245A is characterized for operation over the fullmilitary temperature range of -55°C to 125°C. TheSN74BCT8245A is characterized for operation from 0°C to70°C.

View more information about generic part numbers:SN54BCT8245A, SN74BCT8245A

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