SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS

SCBS042E - FEBRUARY 1990 - REVISED JULY 1996

features

Members of the Texas Instruments SCOPE^TM Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPE^TM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)

SCOPE is a trademark of Texas InstrumentsIncorporated.

description

The 'BCT8244A scan test devices with octal buffers are members ofthe Texas Instruments SCOPE^TM testabilityintegrated-circuit family. This family of devices supports IEEEStandard 1149.1-1990 boundary scan to facilitate testing of complexcircuit-board assemblies. Scan access to the test circuitry isaccomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent tothe 'F244 and 'BCT244 octal buffers. The test circuitry can beactivated by the TAP to take snapshot samples of the data appearingat the device terminals or to perform a self test on theboundary-test cells. Activating the TAP in normal mode does notaffect the functional operation of the SCOPE^TM octalbuffers.

In the test mode, the normal operation of the SCOPE^TMoctal buffers is inhibited and the test circuitry is enabled toobserve and control the I/O boundary of the device. When enabled, thetest circuitry can perform boundary-scan test operations, asdescribed in IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the testcircuitry: test data input (TDI), test data output (TDO), test modeselect (TMS), and test clock (TCK). Additionally, the test circuitryperforms other testing functions such as parallel-signature analysis(PSA) on data inputs and pseudo-random pattern generation (PRPG) fromdata outputs. All testing and scan operations are synchronized to theTAP interface.

The SN54BCT8244A is characterized for operation over the fullmilitary temperature range of -55°C to 125°C. TheSN74BCT8244A is characterized for operation from 0°C to70°C.

Title: SCAN TEST DEVICES WITH OCTAL BUFFERS
Product Family: BUS DEVICES
Device Functionality: SCAN TEST, BUFFER
Orderable Devices: SNJ54BCT8244AFK, SNJ54BCT8244AJT, SN74BCT8244ADW, SN74BCT8244ADWR, SN74BCT8244ANT

View the complete PDF datasheet: scbs042e.pdf (274 K Bytes) (Requires Acrobat Reader 3.x)

View more information about generic part numbers:SN54BCT8244A, SN74BCT8244A

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