SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

SCAS157D - APRIL 1990 - REVISED DECEMBER 1996

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features

Members of the Texas Instruments SCOPE^TM Family of Testability Products
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus
Allow Partitioning of System Scan Paths
Can Be Cascaded Horizontally or Vertically
Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path
Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals
Include 4-Bit Identification Bus for Scan-Path Identification
Inputs Are TTL Compatible
EPIC^TM (Enhanced-Performance Implanted CMOS) 1-m Process
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

SCOPE and EPIC are trademarks of Texas InstrumentsIncorporated.

description

The 'ACT8997 are members of the Texas InstrumentsSCOPE^TM testability integrated-circuit family. This familyof components facilitates testing of complex circuit-boardassemblies.

The 'ACT8997 enhance the scan capability of TI'sSCOPE^TM family by allowing augmentation of a system'sprimary scan path with secondary scan paths (SSPs), which can beindividually selected by the 'ACT8997 for inclusion in the primaryscan path. These devices also provide buffering of test signals toreduce the need for external logic.

By loading the proper values into the instruction register anddata registers, the user can select up to four SSPs to be included ina primary scan path. Any combination of the SSPs can be selected at atime. Any of the device's six data registers or the instructionregister can be placed in the device's scan path, i.e., placedbetween test data input (TDI) and test data output (TDO) forsubsequent shift and scan operations.

All operations of the device except counting are synchronous tothe test clock pin (TCK). The 8-bit programmable up/down counter canbe used to count transitions on the device condition input (DCI) pinand output interrupt signals via the device condition output (DCO)pin. The device can be configured to count on either the rising orfalling edge of DCI.

The test access port (TAP) controller is a finite-state machinecompatible with IEEE Standard 1149.1.

The SN54ACT8997 is characterized for operation over the fullmilitary temperature range of -55°C to 125°C. TheSN74ACT8997 is characterized for operation from 0°C to70°C.

Title: SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD
Product Family: SCAN SUPPORT DEVICES
Device Functionality: SCAN PATH LINKERS
Orderable Devices: SNJ54ACT8997FK, SNJ54ACT8997JT, SN74ACT8997DW, SN74ACT8997DWR

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View more information about generic part numbers:SN54ACT8997, SN74ACT8997

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