Texas Instruments
SemiconductorsSearchFeedbackTI Home
Engineering Design CenterDSP SolutionsSC in the newsSC Product InformationSC Applications & TechnologiesSC Service & Support

Application Report Abstract

A HARDWARE MONITOR USING TMS320C40 ANALYSIS MODULE & JTAG FOR PERF MEASUREMENTS

This application report describes the design and implementation of a hardware monitor that provides information from the processor level up to the application level. It uses the on-chip analysis module of the Texas Instruments (TI(TM)) TMS320C40 digital signal processor (DSP) and a boundary-scan technique according to the IEEE 1149.1 JTAG-standard. The monitor can be used for both single processor and multiprocessor systems. There is no limit on the number of processors monitored. An instrumentation of the software running on the DSPs is not required. The monitor influences the application in terms of runtime but does not change the order of events.

This document was an entry in the 1995 DSP Solutions Challenge, an annual contest organized by TI to encourage students from around the world to find innovative ways to use DSPs. For more information on the TI DSP Solutions Challenge, see TI's World Wide Web site at www.ti.com.

*DISCLAIMER: This document was part of the DSP Solution Challenge 1995 European Team Papers. It may have been written by someone whose native language is not English. TI assumes no liability for the quality of writing and/or the accuracy of the information contained herein.


View the complete PDF document: spra308.pdf (507 K Bytes) (Requires Acrobat Reader 3.x)

Go to the Engineering Design Center to locate information on other TI Semiconductor devices.

SemiconductorsSearchFeedbackTI Home
(c) Copyright 1998 Texas Instruments Incorporated. All rights reserved.
Trademarks, Important Notice!