



METASTABILITY PERFORMANCE OF CLOCKED FIFOSThis document helps the user understand the metastable performance of TLI clocked FIFOs in asynchronous-system applications. A basic discussion of metastable-operation theory, the equations to calculate metastable failure rates for 1- and 2-stage synchronization, and an approach used for synchronizing the state flags on a series of TI clocked FIFOs is provided. A test setup to measure the failure rate of a device to determine its metastable parameters is given with results for advanced BiCMOS (ABT) and advanced CMOS (ACT) FIFOs. View the complete PDF document: scza004a.pdf (60 K Bytes) (Requires Acrobat Reader 3.x) Go to the Engineering Design Center to locate information on other TI Semiconductor devices.
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