JTAG-COMPATIBLE DEVICES SIMPLIFY BOARD LEVEL DESIGN FOR TESTABILITY

The IEEE 1149.1 standard developed by the Joint Test Action Group (JTAG) provides a framework for a structured test approach to improve IC and board level testing while eliminating after-the-fact test approaches. This document previews three integrated circuits (ICs), a test bus controller (TBC), a SCOPE scan path selector (SPS), and a SCOPE digital bus monitor (DBM) that support the standard for device testing. This document is reprinted with the permission of the IEEE.

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