



SCAN-BASED DESIGN VERIFICATION- AN ALTERNATIVE APPROACHThe formalization of the IEEE 1149.1 boundary-scan standard provides and infrastructure that aids test engineers and assists design engineers in the debug of hardware and software. This document provides and overview of the test standardization process and discusses a scan-based debug and integration compliant with IEEE 1149.1. The test, its results and the limitations of the standard are discussed in the article.
View the complete PDF document: scta038.pdf (440 K Bytes) (Requires Acrobat Reader 3.x) Go to the Engineering Design Center to locate information on other TI Semiconductor devices.
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