



WHAT'S AN LFSR?This document describes the linear feedback shift register (LFSR), fault grading, pseudorandom pattern generation (PRPG), and a parallel signature analyser (PSA). An LFSR and PSA are used to test a TI application-specific integrated circuit (ASIC) using SCOPE cells. SCOPE cells are compatible with IEEE1149.1 or boundary-scan. An implementation of the PSA and LSFR using SCOPE boundary-scan cells is included. View the complete PDF document: scta036a.pdf (52 K Bytes) (Requires Acrobat Reader 3.x) Go to the Engineering Design Center to locate information on other TI Semiconductor devices.
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