HIERARCHICALLY ACCESSING IEEE 1149.1 APPLICATIONS IN A SYSTEM ENVIRONMENT

This document shows a method that enables an IEEE 1149.1 (JTAG) boundary-scan test bus controller to hierarchically access and test 1149.1 circuits independent of circuit location within electronic systems. This approach allows the 1149.1 test bus to be used hierarchically as a system level test bus instead of restricting its use to the board level. An example of the connections for the hierarchical access is provided. This document is reprinted with permission of the IEEE.

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