PARTITIONING DESIGNS WITH IEEE 1149.1 SCAN CAPABILITIESThis document provides an overview of the scan-path linker (SPL) and the scan-path selector (SPS) used to implement IEEE 1149.1 boundary-scan test. It discusses the use of remote bus controller interfaces and partitioning IEEE 1149.1 designs that use the scan-path support devices. The SN74ACT8999 is used in a SPS design and the SN74ACT8997 is used in a SPL design. View the complete PDF document: scta031.pdf (474 K Bytes) (Requires Acrobat Reader 3.x) Go to the Engineering Design Center to locate information on other TI Semiconductor devices.
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