BOUNDARY SCAN SPEEDS STATIC MEMORY TESTS

The steady increase in memory densities used in microprocessor based systems has stretched functional test times. The boundary scan standard IEEE 1149.1 offers a solution to the problem of testing static memory by supplying the access needed to control built-in-self-test (BIST) functions. This document describes generation patterns, using parallel signature analysis (PSA), and BIST generated waveforms to speed static memory testing.

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