



SIMULTANEOUS-SWITCHING NOISE ANALYSIS FOR TEXAS INSTRUMENTS FIFO PRODUCTSIn the high-speed advanced logic families, including ACT and ABT FIFO products, analysis of circuit noise immunity during simultaneous switching of multiple outputs is crucial. This document provides a thorough explanation of noise reduction techniques for TI FIFO devices. It is designed to assist component and system design engineers in the evaluation of simultaneous switching noise for ACT and ABT FIFO products. The appendix shows individual FIFO plots of VOLP and VOHV measurements and the different types of FIFO packaging. View the complete PDF document: scaa008a.pdf (137 K Bytes) (Requires Acrobat Reader 3.x) Go to the Engineering Design Center to locate information on other TI Semiconductor devices.
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