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Embedded test bus controller Makes IEEE JTAG affordable for system-level test One of the growing applications for the IEEE 1149.1 (JTAG) standard is embedded system-level test architectures. To take advantage of 1149.1 test structures for these applications, a test controller with interface capabilities to embedded DSPs, microcontrollers, and microprocessors must be designed into the end equipment to manipulate and control serial scan data. The TI SN74LVT8980 test-bus controller (TBC) solution makes embedded TBC applications affordable to a wide range of systems with a lower price, increased ease-of-use, reduced size, and low-voltage (3.3 V) power. The ’LVT8980 provides system-level built-in test, in-system emulation, and in-system programming functions which execute as high-level code on the embedded host CPU. The new device controls low-level test bus operations, enabling the host to use higher-level abstraction such as: Moving from test access port (TAP) state to TAP state Scanning instruction register or data register, including pre/post-scan state movements Running built-in system test operations in the Runtest/Idle state for a fixed number of clocks. It also provides the flexibility of operating with a free-running or gated test clock. The ’LVT8980 is available from TI and authorized distributors. For pricing information, please contact your local TI sales office.